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主页 > 支持 > 器件 > BSDL/BST > HardCopy II BSDL Files 打印此页 发送此页 HardCopy II BSDL Files Browse boundary-scan description language (BSDL) files by specific device and choose the appropriate device package. You can use the same BSDL file regardless of speed grade or temperature. For HardCopy® II devices, you can perform the boundary-scan test prior to user mode (that is, with nConfig pulled to low) or in user mode. Boundary-Scan Test (BST) Prior to User Mode Prior to user mode, all user I/Os default to the LVTTL 3.3-V I/O standard. You can capture data into the boundary-scan cell (BSC) and drive data onto the pins by using Joint Test Action Group (JTAG) instructions on all the user I/O pins. Because of silicon restrictions, BST prior to user mode for HC230 has the following exceptions: Logic level on user I/Os programmed as output pins cannot be captured into the boundary scan cells. Only logic level on input and bidirectional single-ended I/Os can be captured into the BSC by JTAG instructions. User I/Os programmed as differential input or output pin pair can drive data independently, but cannot capture data on the pins into the boundary-scan cell. All I/O standards are determined by mask programmed settings instead of LVTTL 3.3 V. For HC210, HC210W, HC220, and HC240 devices prior to user mode, you cannot drive or receive signals from other devices on the board using voltage-referenced standards because these pins use the defaulted LVTTL 3.3-V standard for chip-to-chip communication. If your design uses a lot of differential pin pairs, Altera recommends performing BST prior to user mode to improve boundary-scan test coverage. Follow the steps below to generate a BSDL file that is customized to your design for BST prior to user mode: Download the generic HardCopy II BSDL file from the Altera® website. Generate a new BSDL file that is customized to your design by using the Preconfig BSDLCustomizer tool available at www.altera.com/support/devices/bsdl/bsdl.html. Boundary-Scan Test (BST) In User Mode For HardCopy II devices in user mode, the I/O standards for all user I/Os are determined by masked programmed settings.Thus, all user I/Os have the appropriate electrical standards for chip-to-chip communication.The major drawback for BST in user mode is the reduction in BST coverage for differential pin pairs because the following pins are not testable: n-side of differential pin pairs LVDS pin pairs If you decide to perform BST in user mode, follow the steps below to generate a BSDL file that is customized to your design for boundary scan test in user mode: Download the generic HardCopy II BSDL file from the Altera website. Generate a new BSDL file that is customized to your design by using the BSDLCustomizer tool available at  www.altera.com/support/devices/bsdl/bsdl.html. IEEE 1149.1 Compliant HardCopy II BSDL Files (1) Device Package File Code Version HC210 484-pin FineLine BGA HC210F484 1.00 HC210W 484-pin FineLine BGA HC210WF484 2.02 HC220 672-pin FineLine BGA HC220F672 1.00 780-pin FineLine BGA HC220F780 1.00 HC230 1020-pin FineLine BGA HC230F1020 2.01 HC240 1020-pin FineLine BGA HC240F1020 1.00 1508-pin FineLine BGA HC240F1508 1.00 Note to Table:   (1) The BSDL Files are syntax checked using these tools: JTAG Technologies ASSET Intertech - Agilent Technologies Corelis Goepel electronic Temento Systems Questions or concerns about the contents of these files, can be directed to Altera's mySupport. For information on boundary-scan testing, refer to the Related Documents links on Altera BSDL Support page. 给本页评分

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